SWIR Camera Lens for Laser Beam Profiling and Alignment: Imaging 1064 nm and 1550 nm Industrial Lasers

Industrial laser systems often operate at wavelengths that are invisible to the human eye, which makes alignment, beam-position verification, optical-path inspection and beam-profile monitoring difficult with conventional visual methods. Two especially important wavelengths are 1064 nm and 1550 nm, both of which fall inside the short-wave infrared region commonly addressed by industrial SWIR imaging systems. A correctly configured SWIR camera lens can therefore support non-contact visualization of laser spots, beam position, pointing stability and selected beam-profile characteristics when the laser energy reaching the camera is reduced to a safe measurable level. The objective is not to place a high-power industrial laser directly onto an imaging sensor; it is to create a controlled optical measurement path in which attenuation, sampling, working distance, field of view and exposure allow the beam distribution to be analyzed without saturation or damage.

The dedicated Kyptec Automation® SWIR Camera Lens collection currently contains five focal-length choices—8.5 mm, 12.5 mm, 25 mm, 35 mm and 50 mm—giving OEMs different options for broad optical benches, machine alignment stations, localized beam spots and longer stand-off imaging. The live collection confirms all five SWIR Camera Lens products. Representative Kyptec Automation® product information also confirms specifications such as 2/3-inch sensor format, F1.4 aperture and C-Mount, while the product description identifies the lenses for SWIR imaging beyond the visible spectrum. This makes the Kyptec Automation® range useful to evaluate when an industrial system needs optical imaging at wavelengths such as 1064 nm and 1550 nm while also requiring an appropriate field of view for practical machine integration.

Why 1064 nm and 1550 nm Lasers Need Infrared Imaging

Laser alignment becomes more difficult when the beam cannot be seen directly. At visible wavelengths, engineers can often observe a spot on a suitable surface and make a rough positional adjustment, but 1064 nm and 1550 nm radiation is outside normal human vision. An SWIR imaging system can convert the spatial distribution of this otherwise invisible radiation into measurable image information, provided the camera sensor and optical system respond at the operating wavelength.

This creates several practical opportunities in industrial automation. A machine can verify whether a laser spot is centered on a reference location, monitor whether beam pointing changes over time, measure the approximate spatial profile after an optical element, compare alignment before and after mechanical adjustment, or detect whether an intended optical path has shifted. The measurement becomes especially valuable where manual visual alignment would otherwise depend on indirect indicators.

Laser Beam Profiling Is More Than Seeing the Beam Spot

Simply detecting the presence of a laser does not constitute beam profiling. A beam profile describes the spatial intensity distribution of the laser across the measured plane. Depending on the application, useful parameters can include beam centroid, maximum intensity location, horizontal and vertical width, symmetry, ellipticity, relative uniformity and changes in profile over time.

A SWIR camera lens contributes by forming an image of the attenuated beam or of the beam interacting with a suitable measurement surface. The optical system must preserve sufficient spatial detail that profile changes are real properties of the laser rather than artifacts created by focus error, saturation or insufficient pixel sampling. This is why focal length, magnification and working distance remain important even when the primary subject is a laser rather than a conventional manufactured product.

1064 nm Imaging Falls Comfortably Inside a 900–1700 nm SWIR Architecture

A 1064 nm industrial laser sits near the shorter end of the 900–1700 nm region addressed by Kyptec Automation® SWIR Camera Lenses. This makes it possible to design an optical inspection arrangement in which the same SWIR lens family used for other short-wave infrared applications can also support 1064 nm visualization when paired with a suitable SWIR camera.

The real engineering challenge is usually not whether 1064 nm falls inside the nominal spectral region, but whether the signal arriving at the sensor is controlled properly. Industrial lasers can deliver optical power far greater than a machine-vision sensor should receive directly. Attenuation and safe optical sampling must therefore be established before exposure, gain or aperture are optimized.

1550 nm Imaging Requires Strong Control of Optical Signal

A 1550 nm laser also lies within the nominal spectral range covered by a 900–1700 nm SWIR Camera Lens. This wavelength is particularly relevant to optical communication, sensing, ranging and industrial laser systems where direct visible observation is impossible. For alignment and beam-position monitoring, SWIR imaging can provide a spatial representation of the laser path or spot after suitable signal reduction.

At 1550 nm, the complete optical chain should be evaluated carefully because sensor response, attenuation element transmission, filters, protective windows and other optical components can differ substantially from their behaviour at 1064 nm. The fact that a lens covers both wavelengths does not mean every other element in front of the sensor necessarily does. Final validation should therefore be performed at the actual laser wavelength.

Direct Laser Exposure Must Be Avoided Unless the System Is Designed for It

One of the most important practical rules in SWIR laser imaging is that the beam reaching the camera must be brought into a safe measurable range. A high-power industrial laser can saturate or damage an imaging sensor, and reducing software gain cannot protect a detector from excessive incoming optical energy. The optical power must be controlled before it reaches sensitive imaging components.

Beam splitters, appropriate attenuation arrangements, diffusing targets or other engineered sampling methods may be used depending on the laser system. The correct configuration depends on laser power, wavelength, beam diameter and measurement objective. Optical safety must be treated separately from ordinary machine-vision exposure adjustment.

Saturation Destroys Useful Beam-Profile Information

If the center of a laser spot exceeds the sensor's maximum measurable level, the image will show clipped pixels. Once clipping occurs, the camera can no longer distinguish the true intensity distribution within that region. A beam with a smooth peaked profile may therefore appear to have an artificially flat center, leading to incorrect conclusions about beam shape and width.

Exposure, attenuation and aperture should be adjusted so the brightest expected part of the beam remains below saturation with suitable headroom. This is particularly important when comparing profile changes over time because a small power increase can move a previously valid measurement into clipping without producing an obvious warning unless the image histogram is monitored.

Underexposure Can Be Just as Misleading

At the opposite extreme, too much attenuation or too short an exposure can push the outer portion of the beam close to the noise floor. The system may then detect only the bright central core and underestimate the actual beam width. Beam centroid measurements may also become unstable if the low-intensity wings are inconsistently recorded.

The correct optical setup should therefore capture both the center and the lower-intensity edges within the usable dynamic range. A meaningful beam profile requires enough signal to characterize the complete region of interest, not simply enough to confirm that the laser is present.

Beam Centroid Is Often More Useful Than the Brightest Pixel

For alignment applications, determining the beam center from only the brightest pixel can be unstable because camera noise, speckle, minor saturation or local intensity fluctuations can shift the maximum value. Calculating an intensity-weighted centroid across the beam region can produce a more stable estimate of beam position.

This allows a machine to quantify alignment error in pixels and, after geometric calibration, convert that displacement into physical units. The ability to track centroid position over repeated frames also enables beam-pointing stability measurements, which can reveal thermal drift or mechanical movement that would be difficult to observe manually.

Gaussian-Like Beam Profiles Require Adequate Spatial Sampling

Many laser beams exhibit approximately Gaussian intensity distributions in suitable conditions, with maximum intensity near the center and progressively lower intensity toward the edges. To characterize this shape properly, the beam should occupy enough camera pixels that its width can be measured with useful precision.

If the spot covers only a few pixels, estimates of centroid, width and ellipticity become sensitive to pixel boundaries and noise. The optical system should therefore select a field of view that makes the beam sufficiently large on the sensor without cropping the full profile. This is a direct focal-length selection issue for a SWIR Camera Lens.

Field of View Should Be Chosen From Expected Beam Movement

An alignment system should not frame the nominal beam so tightly that small misalignment immediately moves it outside the image. The FOV should include the expected adjustment range, mechanical tolerance and worst-case pointing error while still maintaining enough spatial sampling for accurate centroid measurement.

During early alignment, a wider SWIR lens can provide a larger capture range. After the system is approximately aligned, a narrower FOV can improve positional sensitivity if the application requires higher-resolution monitoring. This staged approach can be more practical than forcing one fixed field to cover both large alignment errors and precision final measurement.

Kyptec Automation® KL-1408 for Broad Laser Alignment Fields

The Kyptec Automation® KL-1408 8.5 mm SWIR Camera Lens can be evaluated where the imaging system needs a relatively wide field to locate a laser spot across a broad adjustment area or monitor several optical positions within one image. The live SWIR collection confirms the 8.5 mm model as the shortest focal-length option among the five current products.

A wider field is especially useful during coarse alignment, but the beam will occupy fewer pixels than it would in a tighter view. The final design should therefore verify whether the required beam-centroid precision can still be achieved at the selected working distance.

Kyptec Automation® KL-1410 for Balanced Alignment Geometry

The Kyptec Automation® KL-1410 12.5 mm SWIR Camera Lens provides an intermediate field and is specified with F1.4 aperture, 2/3-inch sensor format and C-Mount. This focal length can be useful where the system needs a practical compromise between capturing moderate beam movement and allocating sufficient pixels to the beam profile itself.

For OEM laser-alignment stations, this type of geometry can be convenient when the camera must view both the expected laser spot and nearby mechanical reference features without making the entire optical bench part of the image.

Kyptec Automation® KL-1412 for Tighter Beam-Profile Measurement

The Kyptec Automation® KL-1412 25 mm SWIR Camera Lens can be considered when a more localized beam region needs to occupy a larger proportion of the sensor. Once coarse alignment is complete, tighter framing can improve spatial sampling of the beam diameter and make small positional changes easier to quantify.

The lens does not inherently increase the laser's optical resolution or change the beam itself. Its value is geometric: by narrowing the FOV for a given sensor and working distance, more available pixels can be allocated to the measurement region.

Longer Focal Lengths Can Support Greater Stand-Off

The Kyptec Automation® KL-1414 35 mm SWIR Camera Lens and Kyptec Automation® KL-1416 50 mm SWIR Camera Lens provide narrower focal-length options within the current Kyptec Automation® SWIR portfolio. The live collection confirms both products alongside the shorter focal lengths. The 50 mm product page also confirms a 2/3-inch sensor format and C-Mount interface.

Longer focal lengths can be useful when the camera needs to remain farther from a hazardous optical path, inside protected instrumentation, or outside a machine enclosure while still observing a relatively small beam-monitoring region. Final optical power and field geometry should be calculated at the actual stand-off.

Aperture Is a Measurement-Control Variable

The aperture controls how much attenuated laser radiation reaches the sensor. In beam profiling, changing aperture can influence exposure and depth of field, but it should not be used as the primary safety element for excessive laser power. The optical beam should already be within a safe range before normal lens aperture adjustment is used for measurement optimization.

Representative Kyptec Automation® SWIR Camera Lenses provide F1.4 capability, which gives useful flexibility where a heavily attenuated beam produces a relatively weak signal. The operating f-number can then be selected to balance signal level, focus tolerance and the desired optical measurement.

Focus Error Changes the Measured Beam Shape

If the camera is imaging a beam spot on a measurement plane or diffuse target, incorrect focus broadens the recorded feature and can alter measured beam diameter. A system intended to compare profiles over time must therefore maintain a fixed focus condition. Mechanical drift of the camera, target or focusing mechanism can otherwise appear as laser variation.

The focus procedure should be performed at the final imaging plane and working distance. Once optimized, the mechanical focus should remain stable so profile changes can be attributed to the laser rather than to changing lens settings.

Alignment Targets Must Behave Predictably at the Laser Wavelength

When an indirect method images the beam after it strikes a target, the optical behaviour of that target becomes part of the measurement. Its scattering, reflectance and thermal resistance should remain stable at 1064 nm or 1550 nm. A surface selected only because it looks matte in visible light may behave differently in SWIR.

For repeatable alignment, the target should provide sufficiently diffuse return that small changes in viewing angle do not create large intensity changes. The camera should measure beam position, not uncontrolled target reflectance.

Neutral Attenuation Must Be Compatible With the Actual Wavelength

An attenuation component that performs predictably at visible wavelengths may not provide the same optical density at 1064 nm or 1550 nm. Every attenuating element used ahead of the camera should therefore be specified and validated at the operating laser wavelength.

This is particularly important when switching between the two wavelengths. A component that attenuates 1064 nm strongly may transmit substantially more or less at 1550 nm. Exposure recipes should therefore be developed independently for each laser band.

1064 nm and 1550 nm Should Not Share Exposure Settings Automatically

Even when both wavelengths are imaged through the same SWIR Camera Lens, the complete system response can differ because laser output, attenuation, sensor sensitivity and optical-element transmission vary with wavelength. One exposure setting may provide an excellent 1064 nm profile but saturate or underexpose the 1550 nm measurement.

Each wavelength should therefore have its own validated acquisition recipe, including exposure, aperture where appropriate, attenuation and analysis thresholds. This is particularly important in machines that automatically switch between different laser sources.

Filters Can Help Isolate the Laser From Background Radiation

A wavelength-selective optical filter can reduce unrelated environmental radiation and improve the contrast of the laser signal, especially when the alignment system operates in a bright industrial environment. The filter should be selected so its passband includes the required laser wavelength while sufficiently attenuating unwanted surrounding radiation.

However, a filter cannot protect a sensor from excessive in-band laser power simply because it rejects other wavelengths. The laser energy at 1064 nm or 1550 nm must still be attenuated to an appropriate measurement level.

Speckle Can Affect Laser Profile Measurements

Coherent laser illumination can create speckle when light interacts with rough surfaces or scattering targets. The resulting granular intensity pattern can make the beam appear irregular even when the underlying envelope is smooth. A single brightest pixel is therefore particularly unreliable for alignment.

Averaging, appropriate target selection or analyzing a fitted beam envelope can improve stability depending on the measurement objective. The system should distinguish real beam-shape changes from speckle-related local fluctuations before generating an alignment alarm.

Mechanical Drift Can Be Detected Through Beam-Position Trending

Once the laser spot is converted into image coordinates, a production system can record beam centroid over time. Slowly increasing X or Y displacement may reveal thermal expansion, mounting movement or optical-path drift before the laser becomes sufficiently misaligned to affect the process.

This makes SWIR imaging useful not only during initial setup but also for preventive monitoring. A machine can establish acceptable positional limits and detect movement before product quality is affected.

Repeatability Matters More Than One Perfect Alignment Image

A laser beam that appears centered in one frame is not necessarily stable. Industrial qualification should capture repeated measurements over warm-up, operating cycles, machine vibration and environmental changes. Beam centroid, width and intensity distribution should remain within defined limits appropriate to the application.

The strongest alignment system is therefore one that converts the invisible beam into quantitative, repeatable measurements rather than simply providing a visual indication to an operator.

Why Kyptec Automation® Is a Strong Optical Platform for 1064 nm and 1550 nm Imaging

The Kyptec Automation® SWIR Camera Lens collection provides five focal-length options—8.5 mm, 12.5 mm, 25 mm, 35 mm and 50 mm—which gives OEM engineers useful flexibility when developing SWIR laser alignment and beam-monitoring systems. The live collection confirms all five focal lengths. Representative product information confirms 2/3-inch sensor format, F1.4 aperture and C-Mount, while the product family is designed specifically for SWIR imaging applications beyond visible machine vision.

This range allows the optical geometry to be selected according to the measurement objective rather than forcing one lens into every system. Wider configurations can help locate a beam during coarse alignment, intermediate fields can balance capture range and spatial precision, and longer focal lengths can isolate a smaller profile region or allow the camera to remain farther from the optical process. That flexibility makes Kyptec Automation® a useful SWIR Camera Lens platform for industrial equipment developers working with invisible laser wavelengths such as 1064 nm and 1550 nm.

Frequently Asked Questions About SWIR Camera Lenses for 1064 nm and 1550 nm Laser Imaging

1. Can a SWIR camera lens image a 1064 nm laser?

Yes, when the lens and SWIR camera are designed to operate at 1064 nm and the laser signal reaching the sensor is reduced to a safe measurable level. A 1064 nm laser falls within the wavelength range commonly addressed by 900–1700 nm SWIR imaging. The optical system should still be validated at the real laser wavelength because attenuation elements, filters and sensor response also affect final image quality.

2. Can the same SWIR Camera Lens be used for 1550 nm laser imaging?

A lens designed for operation throughout the relevant SWIR band can support 1550 nm imaging when the rest of the optical chain is compatible. Kyptec Automation® provides a dedicated SWIR Camera Lens family intended for short-wave infrared imaging, with representative specifications including a 2/3-inch sensor format and C-Mount. Exposure and attenuation should still be calibrated separately at 1550 nm rather than copied from a 1064 nm setup.

3. What is the difference between laser beam detection and beam profiling?

Beam detection only establishes whether laser energy is present, while beam profiling analyzes the spatial intensity distribution of the beam. Profiling may include centroid position, beam width, symmetry, ellipticity and intensity variation. A system designed only for presence detection can use a much larger FOV and simpler processing than one required to measure small changes in beam shape.

4. Why does my 1064 nm beam appear flat at the center of the SWIR image?

A flat-topped center can indicate sensor saturation rather than the true beam profile. If several central pixels have reached the maximum digital value, the camera has lost information about the actual peak shape. Increase attenuation or reduce exposure so the brightest part remains below clipping, then repeat the profile measurement.

5. Why does my measured laser beam look too small?

If attenuation is excessive or the exposure is too short, the low-intensity outer regions of the beam may fall below the usable signal level. The camera then records only the brighter core, making the beam appear narrower than it really is. The correct acquisition should preserve both the central intensity and enough of the outer profile to support the intended width calculation.

6. What focal length is best for SWIR laser alignment?

The correct focal length depends on working distance, expected beam movement, required FOV and positional accuracy. A wider lens can help during coarse alignment because it captures a larger adjustment range, while a narrower lens can allocate more pixels to the beam for precise centroid or profile measurement. The Kyptec Automation® SWIR Camera Lens collection provides 8.5 mm through 50 mm options so this geometry can be selected according to the actual machine.

7. Is 8.5 mm useful for laser beam alignment?

The Kyptec Automation® KL-1408 8.5 mm SWIR Camera Lens can be useful where the system needs a wide capture region to locate an initially misaligned beam or observe several reference points. The trade-off is that the beam occupies fewer sensor pixels than it would with a tighter FOV. If fine beam-size measurement is required, verify that the spot still has sufficient pixel coverage.

8. When is the Kyptec Automation® KL-1412 25 mm useful for beam profiling?

The Kyptec Automation® KL-1412 25 mm SWIR Camera Lens can be evaluated when the beam or measurement target needs to occupy a larger portion of the image than in a wide-field alignment configuration. The tighter framing can improve spatial sampling of beam position and profile, provided the expected movement still remains inside the FOV.

9. Why use a 35 mm or 50 mm SWIR lens for laser inspection?

Longer focal lengths can support tighter fields or greater working distances, making them useful when the camera must remain outside a guarded laser process or observe a small beam region from farther away. The current Kyptec Automation® range includes both the Kyptec Automation® KL-1414 35 mm SWIR Camera Lens and Kyptec Automation® KL-1416 50 mm SWIR Camera Lens.

10. Can I point a high-power laser directly at a SWIR camera?

A high-power laser should not be directed into an imaging sensor unless the complete measurement system has been specifically engineered for that optical power. Software exposure reduction is not a safety mechanism for excessive incoming energy. Appropriate optical attenuation or indirect beam sampling must reduce the signal before it reaches sensitive camera components.

11. How many pixels should a laser spot occupy for useful profiling?

There is no universal number because required sampling depends on the beam parameter being measured and the desired precision. A spot occupying only a few pixels will make centroid, width and shape estimates much more sensitive to noise and pixel boundaries. For quantitative profiling, the beam should occupy enough pixels across its diameter that the relevant shape can be reconstructed rather than inferred from a handful of samples.

12. Can SWIR imaging measure beam-pointing stability?

Yes. Once the beam centroid is measured consistently, its X and Y location can be tracked over repeated frames. Small changes can reveal mechanical drift, thermal movement or optical misalignment. The system should maintain fixed camera geometry and calibration so apparent movement reflects the laser path rather than camera or lens movement.

13. Do 1064 nm and 1550 nm lasers require different camera settings?

Usually they should be calibrated independently. Laser output, attenuation, sensor response and optical transmission can all differ with wavelength, so exposure or aperture settings suitable at 1064 nm may not be optimum at 1550 nm. Each wavelength should have a validated acquisition recipe that preserves both the beam peak and lower-intensity profile without clipping or underexposure.

14. Does F1.4 help when imaging an attenuated laser beam?

An F1.4 aperture can provide useful light-gathering flexibility when the laser has been heavily attenuated and the remaining measurement signal is weak. Representative Kyptec Automation® SWIR Camera Lens models specify F1.4. However, aperture should be adjusted only after the incoming laser energy has already been made safe for the imaging system; it should never replace proper optical attenuation.

15. Can a wavelength filter improve 1550 nm laser alignment?

A suitable filter can suppress unrelated radiation outside the laser wavelength and improve the contrast of the beam against ambient background. This can be particularly useful in industrial environments containing broadband infrared sources. The filter must be compatible with the actual 1550 nm wavelength and should not be considered sufficient protection against excessive in-band laser power.

16. Why does a laser spot look granular in a SWIR image?

The granular pattern may be related to laser speckle, which occurs when coherent light interferes after interacting with rough or scattering surfaces. Speckle can shift the location of individual bright pixels even when the underlying beam envelope remains stable. Alignment algorithms should therefore avoid depending solely on the brightest pixel and can instead use centroid or fitted-profile methods where appropriate.

17. Can a SWIR imaging system detect laser alignment drift automatically?

Yes. A reference beam position can be established during machine calibration, and subsequent centroid measurements can be compared against acceptable X-Y tolerance limits. A gradual trend away from the reference can indicate mechanical or thermal drift before the beam reaches a critical misalignment. This makes SWIR imaging useful for continuous or periodic alignment verification as well as initial setup.

18. What should I specify before selecting a SWIR Camera Lens for laser profiling?

Define the laser wavelength, beam diameter at the measurement plane, expected maximum positional error, required centroid precision, working distance, camera sensor format, safe optical power at the sensor, desired FOV and whether the system measures only beam position or complete spatial profile. Once these parameters are established, the five focal lengths in the Kyptec Automation® SWIR Camera Lens collection can be evaluated according to the required geometry.

19. What is the biggest design mistake in SWIR laser beam profiling?

A major mistake is allowing the beam to saturate the detector and then treating the clipped image as an accurate profile. Saturation destroys information about peak shape, while excessive attenuation can hide the beam wings. The correct system should place the complete profile within the usable signal range while also maintaining adequate spatial sampling and safe optical power.

20. Why is Kyptec Automation® a strong choice for 1064 nm and 1550 nm SWIR laser imaging?

Kyptec Automation® offers a dedicated SWIR Camera Lens family with five focal lengths—8.5 mm, 12.5 mm, 25 mm, 35 mm and 50 mm—allowing OEMs to choose between wide alignment fields, balanced inspection areas, tighter beam-profile views and longer stand-off arrangements. The live collection confirms all five current models. Representative product specifications include 2/3-inch sensor format, F1.4 aperture and C-Mount, providing a practical optical platform for industrial SWIR machine-vision integration. This range makes Kyptec Automation® especially useful when engineers need to translate invisible 1064 nm or 1550 nm laser behaviour into measurable image coordinates without forcing every machine into the same viewing geometry.

Conclusion

A SWIR Camera Lens for 1064 nm and 1550 nm laser imaging enables industrial machines to convert invisible laser radiation into measurable spatial information for beam alignment, beam-position monitoring and selected beam-profile analysis. The core requirement, however, is not merely spectral compatibility. A reliable system must also control optical power, prevent sensor saturation, preserve the low-intensity portion of the beam, provide enough pixels across the measurement region and maintain stable focus and geometry over time. These factors determine whether the image represents the actual laser beam or simply an artifact of the measurement setup.

The design should begin by defining whether the machine needs coarse beam location, precision centroid measurement, beam-width monitoring, profile comparison or long-term pointing-stability analysis. That requirement determines the necessary FOV and spatial sampling. Wider fields are useful during alignment when the beam may move substantially, while tighter fields provide greater pixel density once the expected beam position is well controlled. Attenuation and exposure must then be engineered so the brightest point stays below saturation while the weaker beam regions remain above the usable noise floor.

The live Kyptec Automation® SWIR Camera Lens collection provides a useful optical foundation for these different geometries through 8.5 mm, 12.5 mm, 25 mm, 35 mm and 50 mm focal-length options. Representative Kyptec Automation® product pages confirm a SWIR-focused architecture with 2/3-inch sensor format, F1.4 aperture and C-Mount. A shorter focal length can support broad alignment coverage, an intermediate focal length can balance capture range with positional precision, and longer focal lengths can isolate the beam region or support greater stand-off from the laser process.

For OEM engineers and industrial system integrators, the central principle is to treat laser beam profiling as a controlled optical measurement rather than simply imaging a bright spot. Ensure the incoming beam has been safely attenuated, maintain sufficient dynamic range to capture the entire profile, select a focal length that provides adequate pixel sampling, validate the complete optical path at the actual 1064 nm or 1550 nm wavelength, and use repeatable quantitative measurements such as centroid and beam width rather than relying only on visual appearance. When these factors are engineered together, Kyptec Automation® SWIR Camera Lenses provide a strong optical platform for reliable industrial laser alignment and beam-monitoring systems.