SWIR Camera Lens Chromatic Focus Shift: Maintaining Sharp Images Across Multiple Wavelengths from 900 to 1700 nm

A SWIR inspection system can appear perfectly focused at one wavelength and noticeably softer when the illumination changes to another. This effect becomes especially important in broadband and multispectral imaging systems operating across a wide spectral interval such as 900–1700 nm. The reason is fundamental optical physics: the refractive index of optical materials changes with wavelength, so different portions of the SWIR spectrum may not converge at exactly the same image plane. The resulting chromatic focus shift can reduce fine-detail contrast, alter edge sharpness and weaken repeatability even though the camera, object and working distance have not moved.

For engineers searching for a SWIR camera lens with low chromatic focus shift, 900–1700 nm SWIR lens, broadband SWIR lens, SWIR lens for multispectral imaging, infrared chromatic aberration lens, or C-Mount SWIR camera lens, the key purchasing question is therefore not simply whether the lens supports the desired wavelength band. The more important question is whether the complete optical system maintains sufficient focus and useful image quality at every wavelength that the application actually uses. The Kyptec Automation® SWIR Camera Lens collection provides 8.5 mm, 12.5 mm, 25 mm, 35 mm and 50 mm focal-length options within a dedicated 900–1700 nm, 2 MP, 2/3-inch, F1.4 and C-Mount family, giving OEMs and machine-vision integrators a focused platform for designing wavelength-sensitive SWIR imaging systems.

What Chromatic Focus Shift Means in a SWIR Camera Lens

Chromatic focus shift occurs because different wavelengths can be brought to best focus at slightly different axial positions. If the sensor remains fixed while the wavelength changes, some spectral bands may reach the detector at optimal focus while others arrive slightly before or after their best-focus plane. The practical result is wavelength-dependent sharpness.

This effect is closely related to longitudinal chromatic aberration, sometimes called axial color. In visible imaging it may appear as colored fringes or focus differences among red, green and blue wavelengths. In SWIR imaging, the wavelengths are invisible to the human eye, so the problem normally appears as changes in edge sharpness, contrast or measurable feature size when illumination shifts from one infrared band to another.

The wider the wavelength span being used, the more important this becomes. A system operating only around one narrow wavelength can usually be focused specifically for that band. A machine alternating among 1000 nm, 1200 nm, 1450 nm and 1650 nm illumination has a much more demanding optical requirement because all of those bands must remain sufficiently close to the sensor's usable focus region.

Why 900–1700 nm Is a Challenging Broadband Optical Range

The interval from 900 nm to 1700 nm covers a very large change in wavelength. Optical materials do not maintain identical refractive properties throughout this range. As wavelength changes, ray paths through the elements change slightly, potentially moving the best-focus position.

This does not mean that every 900–1700 nm lens will show severe focus shift or that every application needs identical sharpness at the two extreme wavelengths. The practical requirement depends on the smallest feature being inspected, aperture, sensor resolution, depth of focus and which wavelengths are actually used.

A material-identification application examining large homogeneous regions may tolerate more wavelength-dependent blur than a semiconductor inspection system attempting to locate fine alignment marks. The correct lens qualification should therefore be linked to the application's spatial requirement rather than a general concept of visual sharpness.

Chromatic Focus Shift Is Different From Spectral Transmission

A lens can transmit a wavelength effectively while still producing a different best-focus position at that wavelength. Conversely, a wavelength may be well focused yet deliver too little signal for useful imaging. These are separate optical properties.

Spectral transmission concerns how much optical energy passes through the lens. Chromatic focus shift concerns where the wavelength is brought into best focus. Both influence image quality, but they fail in different ways.

If an image becomes darker when wavelength changes but remains sharp, transmission, illumination or sensor sensitivity may be the dominant issue. If image brightness remains adequate but fine edges soften at the new wavelength, focus shift or another wavelength-dependent aberration may be involved.

Understanding this distinction prevents engineers from trying to solve a focus problem by increasing gain or trying to solve a weak-signal problem by refocusing the lens.

Why Multispectral SWIR Systems Are Especially Sensitive to Focus Shift

A multispectral SWIR system may capture several images of the same object using different illumination wavelengths. Those images are then compared to extract material information. This approach is useful in moisture-sensitive analysis, polymer identification, food inspection, semiconductor imaging and other applications where spectral behavior matters.

If each wavelength produces a slightly different blur profile, the resulting images are no longer perfectly equivalent spatial measurements. A small edge may occupy a different apparent width in each band, and fine structures may disappear selectively at wavelengths that are slightly defocused.

This can introduce false spectral variation. The algorithm may interpret a lower pixel intensity as a material difference when part of the change actually comes from blur spreading the feature over neighboring pixels.

For this reason, multispectral systems should validate focus consistency across wavelength, not simply check whether every individual band produces an image.

Why Focus Shift Can Corrupt Pixel-by-Pixel Spectral Comparison

Many spectral classification methods assume that the same image pixel corresponds to the same physical part of the object at every wavelength. If focus changes significantly, light from a small object region can spread into neighboring pixels differently from one band to another.

Consider a narrow contamination spot surrounded by clean material. When sharply focused, pixels inside the spot contain mainly contaminant signal. At a defocused wavelength, light from the surrounding background mixes into those pixels. The apparent spectral signature then changes even if the material itself has not changed.

This effect is particularly important near material boundaries, small particles, thin cracks and narrow seal regions. Large homogeneous regions are less sensitive because neighboring pixels contain similar material.

Maintaining consistent focus therefore helps preserve spectral purity, not merely photographic sharpness.

Axial Chromatic Aberration and Lateral Chromatic Effects Should Be Distinguished

Axial chromatic aberration changes the axial location of best focus with wavelength. Lateral chromatic effects can change image magnification or feature position across wavelengths.

In SWIR multispectral inspection, both can matter. Axial focus shift can soften the image, while wavelength-dependent magnification can create small registration differences between spectral frames.

A system performing pixel-level comparison should therefore evaluate both sharpness and registration. Capturing a calibration target at every production wavelength can reveal whether edges remain in the same location and whether their contrast stays sufficiently consistent.

If the application only uses one illumination wavelength, these multi-band concerns become much less demanding because the lens can be optimized directly for that operating point.

Why Narrowband SWIR Imaging Is Easier to Focus

A narrowband system uses illumination concentrated around a relatively small spectral interval. Because only a limited wavelength range contributes significantly to the image, the lens can be focused directly under that illumination.

This is one reason narrowband SWIR inspection can be attractive when the required material contrast is already known. If an application depends primarily on 1450 nm moisture sensitivity, for example, the system can be focused specifically around the illumination used for that measurement rather than demanding equivalent best focus across the complete 900–1700 nm range.

The trade-off is flexibility. A broadband or multispectral machine can evaluate more spectral information, but the optics and calibration need to remain stable across multiple wavelengths.

The best architecture therefore depends on whether the inspection needs one strong spectral feature or several wavelength-dependent measurements.

Why Focusing Under Visible Light Can Produce Poor SWIR Results

One common integration error is to focus the camera using visible illumination because it is easier for an operator to see, then switch the system to SWIR and assume the focus remains unchanged.

The visible and SWIR best-focus positions may differ. A system can therefore look perfectly focused during setup and become softer when production illumination is activated.

The correct procedure is to perform final focus using the actual SWIR wavelength or wavelength combination that will be used during inspection. If several wavelengths are involved, each should be checked independently after the nominal focus position is established.

For production machines, visible-light focusing should only be treated as a coarse setup aid unless the optical system has been independently proven to maintain the required focus relationship.

Why the Smallest Inspection Feature Determines How Much Focus Shift Is Acceptable

A system inspecting large material regions can tolerate more defocus than one detecting fine scratches, particles or alignment marks. The acceptable chromatic focus shift therefore cannot be defined without knowing the smallest important spatial feature.

Fine details contain higher spatial frequencies and lose contrast rapidly as focus deteriorates. Large regions and broad intensity transitions remain recognizable over a much larger focus error.

A practical validation should therefore use the actual smallest target rather than simply checking whether the image appears sharp to an operator. If a 0.5 mm contaminant is the production limit, test that contaminant at every wavelength. If a fine semiconductor fiducial must be measured, validate repeatability of that exact structure.

This connects chromatic focus performance directly to the real inspection specification.

Why Aperture Can Increase Tolerance to Wavelength-Dependent Focus Shift

Stopping the lens down generally increases depth of focus at the sensor and depth of field in object space. A larger focus tolerance means several wavelength-dependent best-focus positions may remain acceptably sharp at one fixed sensor plane.

This makes aperture a useful control variable in multispectral SWIR system design.

The Kyptec Automation® SWIR Camera Lens family is specified with F1.4 maximum aperture, which gives compatible systems useful light-gathering capability. During integration, the aperture can be optimized according to available illumination and required focus tolerance.

The trade-off is signal. Closing the aperture reduces the optical energy reaching the sensor, so exposure time or illumination may need adjustment. Excessive stopping down can also introduce diffraction-related resolution loss. The best aperture is therefore the point where multi-wavelength focus consistency, signal and spatial detail are balanced rather than maximized independently.

Focus Shift and Depth of Focus Are Two Sides of the Same Design Problem

Chromatic focus shift describes how far best focus moves with wavelength. Depth of focus describes how much sensor-plane focus variation the system can tolerate before image quality becomes unacceptable.

A system can work well even if different wavelengths do not focus at exactly the same position, provided all of those positions fall within an acceptable focus tolerance around the fixed sensor plane.

This is the more useful production question. Perfect coincidence of every wavelength is not always necessary. What matters is whether every wavelength remains sharp enough for the inspection task.

The acceptable focus envelope should therefore be defined using actual defect contrast or measurement repeatability rather than an arbitrary visual criterion.

Why Higher Spatial Resolution Makes Chromatic Focus More Critical

As the required feature size becomes smaller, the system becomes more sensitive to focus error. Fine structures lose contrast much more rapidly than broad shapes.

This means a SWIR lens used for high-detail semiconductor inspection may require tighter wavelength-dependent focus control than the same optical family used for broad moisture mapping.

Sensor sampling also matters. If the camera pixels are relatively large compared with the optical blur, small focus changes may not strongly alter recorded detail. When the sensor samples more finely, optical focus performance becomes increasingly visible in the digital image.

This is why wavelength-dependent focus should be evaluated together with sensor resolution and the smallest production feature, not as an isolated specification.

Why the Kyptec Automation® 8.5 mm Option Should Be Validated Across the Full Field

The Kyptec Automation® KL-1408 8.5 MM SWIR Camera Lens provides the widest focal-length geometry in the current SWIR portfolio and is specified for 900–1700 nm, 2 MP resolution, 2/3-inch format, F1.4 and C-Mount.

Wide-field installations should test wavelength-dependent focus both at the center and near the edges of the usable image. An optical system can remain acceptable near the axis while showing stronger variation off-axis, especially when multiple aberrations interact.

For conveyor inspection, broad material mapping or large-object imaging, representative targets should therefore be moved across the complete field and captured under every wavelength used in production.

Why 12.5 mm Can Be Useful When Wide Coverage Still Needs Better Focus Margin

The Kyptec Automation® KL-1410 12.5 MM SWIR Camera Lens provides an intermediate focal-length option for systems that still require a relatively broad field but do not need the maximum coverage of 8.5 mm.

Reducing unnecessary field coverage can allow the target to occupy more of the sensor, making it easier to assess whether wavelength-dependent blur is affecting the smallest useful feature.

This does not mean 12.5 mm inherently eliminates chromatic focus shift. The benefit comes from better matching the image scale to the inspection requirement so the system has more spatial margin when focus changes slightly between wavelengths.

Focal length and chromatic correction should therefore be treated as separate but interacting design variables.

Best-Focus Position Should Be Measured, Not Guessed

A useful development test is to capture the same target at several controlled focus positions for each illumination wavelength. Image sharpness or contrast can then be plotted against focus position.

The peak of each curve represents the approximate best-focus location for that wavelength. Comparing those peaks shows how much axial shift exists across the operating bands.

This method is far more informative than manually focusing one wavelength and visually checking the others. It can also reveal whether a single compromise focus position provides adequate sharpness across all wavelengths.

The acceptance criterion should be based on the application: edge contrast, defect-detection confidence, dimensional repeatability or another measurable performance indicator.

Choosing a Compromise Focus for Multiple SWIR Wavelengths

If several wavelengths focus at slightly different positions but the machine has a fixed camera and lens, the system may need a compromise focus setting.

The best compromise is not necessarily halfway between the shortest- and longest-wavelength focus positions. The weighting should depend on which wavelengths are most important to the inspection and how sensitive each measurement is to blur.

If one wavelength carries the primary defect information while another is only a reference channel, it may be sensible to prioritize sharpness at the primary wavelength. If all channels are equally important for spectral classification, a position that minimizes total performance loss may be better.

The final setting should be chosen from measured image performance rather than simply averaging mechanical focus positions.

Why Refocusing Between Wavelengths Is Usually Undesirable in High-Speed Production

A laboratory system can physically refocus the lens each time illumination wavelength changes, but this is rarely practical in high-speed industrial inspection. Mechanical movement adds cycle time, wear, repeatability concerns and control complexity.

Production machines normally benefit from a fixed optical configuration that maintains sufficient sharpness across all required bands.

This is why broadband focus performance, aperture optimization and calibration matter so much during system design. The objective is to make wavelength switching an electronic or illumination event rather than a mechanical focusing event.

If the required wavelengths cannot share an acceptable focus envelope, the system architecture itself may need reconsideration.

Why Temperature Can Change the Focus Relationship

Industrial optics and camera assemblies operate over changing temperatures. Lens barrels, mounts, sensor structures and optical materials can expand or contract as temperature changes, shifting the effective focus position.

A system that is already close to its acceptable chromatic-focus limit may therefore perform well during cold startup and become softer after reaching operating temperature.

Production qualification should include thermal stabilization. Capture the same multi-wavelength target shortly after startup and again after the machine reaches its normal working temperature.

If the system operates in a factory with large ambient temperature variation, validation should cover that expected range as well.

Why C-Mount Mechanical Repeatability Matters

Chromatic focus performance can only be controlled if the lens-to-sensor relationship remains stable. C-Mount provides a standardized mechanical interface, but installation tolerances, adapters, locking arrangements and camera mechanics still influence the final sensor position.

The current Kyptec Automation® SWIR Camera Lens family uses C-Mount, providing a practical industrial interface for compatible 2/3-inch SWIR cameras. When multiple machines are being built, however, each production unit should still be focused and verified rather than assuming one mechanical setting will transfer perfectly to every assembly.

Once optimum focus is established, the adjustment should be secured against vibration and accidental movement.

Using 25 mm for Controlled Multi-Wavelength Inspection Regions

The Kyptec Automation® KL-1412 25 MM SWIR Camera Lens provides a medium focal length within the Kyptec Automation® SWIR family. It can be evaluated when multispectral inspection is concentrated on a defined region rather than a very wide scene.

A tighter field allows important spectral features to occupy more pixels, which can make the system less vulnerable to small amounts of wavelength-dependent blur. This is particularly relevant when the algorithm compares local regions or narrow defects across several bands.

The lens should still be tested under each wavelength used by the machine because changing image scale does not remove chromatic focus behavior; it simply changes how that behavior affects the actual inspection feature.

Why Focus Shift Can Affect Dimensional Measurement

Dimensional measurement normally relies on precise edge localization. Defocus reduces edge steepness, spreading the transition over more pixels. If different SWIR wavelengths create different amounts of blur, the measured edge position may vary slightly among spectral channels.

This is particularly important when one wavelength is used for material contrast and another for geometric reference. The system may appear to show a physical movement even though the difference is optical.

Calibration should therefore verify both image registration and measurement repeatability across wavelength.

For precision applications, it may be better to designate one spectral band as the dimensional reference and use other wavelengths primarily for material information.

Why 35 mm Can Support Tighter Feature Inspection

The Kyptec Automation® KL-1414 35 MM SWIR Camera Lens provides a tighter field option for compatible systems requiring more target representation on the sensor.

In semiconductor inspection, electronics analysis, localized packaging inspection or small-area material classification, the increased image scale available under suitable geometry can help preserve useful feature representation when slight focus differences occur across wavelengths.

Again, longer focal length does not automatically mean lower chromatic aberration. Its value is geometric: the target can occupy more of the available 2/3-inch sensor, giving the inspection greater spatial margin.

Why 50 mm Can Be Useful for Narrow Multi-Band Inspection Windows

For applications requiring greater stand-off or a comparatively narrow inspection region, the Kyptec Automation® KL-1416 50 MM SWIR Camera Lens provides the longest focal length in the current portfolio.

A 50 mm configuration can be relevant when a small target region is examined across several SWIR wavelengths and broad field coverage is unnecessary. The smaller field can allow more sensor pixels to represent the important feature, increasing tolerance to moderate blur.

The correct model should nevertheless be selected according to working geometry and feature size, followed by actual wavelength-by-wavelength focus validation.

Production Validation Should Measure Repeatability Across Every Operating Wavelength

A final production test should use representative targets, not just a general resolution chart. Capture known good and defective products under each wavelength the machine will use. Keep camera position, object position and exposure strategy controlled, then compare sharpness, defect contrast and classification output.

Repeat the test at the center and edges of the field, at minimum and maximum expected object heights, and at actual production speed. If temperature varies significantly, repeat after thermal stabilization.

The most important result is not whether all images look identical. It is whether every spectral channel remains sufficiently sharp and spatially consistent for the inspection decision it supports.

Why Kyptec Automation® Is a Practical SWIR Lens Platform for Multi-Wavelength Imaging

Multi-wavelength SWIR machines can require very different field geometries even when they operate over the same spectral range. One system may inspect a wide conveyor while another examines a small semiconductor feature or localized material region.

The Kyptec Automation® SWIR Camera Lens collection addresses these different layouts with five focal lengths—8.5 mm, 12.5 mm, 25 mm, 35 mm and 50 mm—within a consistent published 900–1700 nm, 2 MP, 2/3-inch, F1.4 and C-Mount platform.

For OEMs and system integrators, this provides a useful starting point for wavelength-sensitive optical development because focal length can be matched to the machine while remaining within a dedicated SWIR product family. The strongest implementation is to choose the required geometry first, then qualify the selected Kyptec Automation® SWIR Camera Lens across every wavelength, aperture and temperature condition the production machine will encounter.

Frequently Asked Questions About SWIR Chromatic Focus Shift

1. What is chromatic focus shift in a SWIR camera lens?

Chromatic focus shift is the change in best-focus position that can occur when imaging at different wavelengths. Because optical materials refract 900 nm, 1200 nm, 1450 nm and 1700 nm radiation differently, those wavelengths may not reach peak focus at exactly the same sensor plane. In industrial inspection, the effect appears as wavelength-dependent edge sharpness or fine-detail contrast rather than visible colored fringes.

2. Why does my SWIR image go out of focus when I change illumination wavelength?

The most common optical explanation is wavelength-dependent focus. The lens may have been focused optimally at the first wavelength, while the new wavelength has a slightly different best-focus plane. Confirm the effect by imaging a fixed high-detail target at both wavelengths and adjusting focus slightly. If sharpness peaks at different mechanical positions, chromatic focus shift is likely contributing.

3. Can one SWIR lens remain focused from 900 to 1700 nm?

A lens designed for broadband SWIR use can maintain useful performance across a broad spectral range, but “useful focus” does not necessarily mean every wavelength has an identical mathematical focal plane. The important requirement is that any residual shift remains within the application's acceptable depth of focus. The Kyptec Automation® SWIR Camera Lens portfolio is specified for 900–1700 nm operation and should be validated under the actual wavelength combination required by the machine.

4. What is the difference between chromatic aberration and chromatic focus shift?

Chromatic aberration is the broader category of wavelength-dependent imaging error. Chromatic focus shift normally refers specifically to longitudinal or axial chromatic aberration, where different wavelengths reach best focus at different positions along the optical axis. Other chromatic effects can alter image magnification or feature position across wavelengths.

5. Does aperture affect SWIR chromatic focus shift?

Changing aperture does not necessarily remove the underlying wavelength-dependent focal difference, but stopping down can increase the system's focus tolerance so several wavelengths remain acceptably sharp at one sensor position. The trade-off is reduced optical signal and eventual diffraction loss. The F1.4 capability of Kyptec Automation® SWIR Camera Lenses gives integrators useful flexibility to optimize that balance experimentally.

6. Should I focus a SWIR camera lens at the shortest or longest wavelength?

Neither is automatically correct. Focus should be optimized according to the wavelengths that matter most to the inspection. If one wavelength carries the primary defect information, it may deserve priority. In a true multispectral classification system, a compromise position that keeps all required bands within acceptable sharpness may be preferable. Measure performance instead of choosing solely from wavelength order.

7. Why should I not focus a SWIR inspection system under normal room light?

Visible wavelengths can have a different best-focus position from the SWIR wavelengths used in production. A system focused under room light may therefore become softer after switching to infrared illumination. Final focus should always be established and verified using the actual production SWIR wavelength or wavelength set.

8. Does chromatic focus shift affect material classification?

Yes, particularly for small material regions and boundaries. Wavelength-dependent blur changes how much neighboring material mixes into each pixel. This can alter apparent spectral signatures even when the material itself has not changed. Maintaining consistent sharpness across bands helps keep pixel-level spectral comparisons more reliable.

9. Does chromatic focus shift matter for large-area moisture imaging?

It can matter less than in fine-defect inspection because broad moisture regions contain relatively low spatial frequencies and remain recognizable under modest blur. However, if the system measures small wet spots or compares pixel-level intensity across multiple wavelengths, focus consistency becomes more important. The tolerance should therefore be set from the smallest moisture feature that matters.

10. Can software completely correct SWIR chromatic focus shift?

Software can compensate for some registration differences and may sharpen moderately blurred images, but it cannot reliably recreate fine information that the optics never transferred to the sensor. Optical focus should therefore be made sufficiently consistent before algorithmic correction is applied. Software is best used for residual calibration rather than as a substitute for appropriate lens qualification.

11. How do I measure chromatic focus shift without an optical laboratory?

Mount a fixed high-detail target and capture images at several controlled focus positions for each production wavelength. Measure an image-sharpness or edge-contrast metric and identify the focus position producing the best result at each wavelength. The distance between those optimum positions provides a practical measure of focus shift relevant to the actual camera and application.

12. Does a longer focal-length SWIR lens have less chromatic focus shift?

Not automatically. Chromatic correction depends on optical design and materials rather than focal length alone. A longer focal length such as the Kyptec Automation® KL-1414 35 MM SWIR Camera Lens may provide better target magnification for a particular machine, but it should still be tested across the wavelengths used in production rather than assumed to have lower axial color.

13. Why does temperature change SWIR focus after the machine warms up?

Mechanical structures and optical components can change dimensions slightly with temperature, moving the relationship between the lens and sensor or altering optical behavior. If the system has limited focus margin, this thermal shift can become visible after warm-up. Multi-wavelength production validation should therefore be performed at normal operating temperature rather than immediately after startup.

14. Is chromatic focus shift important when using only one SWIR wavelength?

Usually it is much less important because the lens can simply be focused at that specific wavelength. It becomes a major design concern when a system switches among several widely separated wavelengths or uses broadband illumination. A single-band machine should still focus under its actual SWIR illumination rather than visible light.

15. What should I check before buying a SWIR lens for a multi-wavelength inspection system?

Confirm the required wavelength range, sensor format, C-Mount compatibility, focal length, field of view, working distance, smallest feature, aperture requirements and the exact spectral bands the machine will use. Then test the selected lens at every wavelength using the final camera and representative targets. The Kyptec Automation® SWIR Camera Lens collection offers 8.5 mm through 50 mm options within a dedicated 900–1700 nm platform, giving system designers multiple geometries to qualify for multi-band SWIR inspection.

Conclusion

Chromatic focus shift is one of the less visible but more important optical issues in broadband and multispectral SWIR imaging. A camera can remain mechanically fixed, the object can stay in exactly the same position, and image brightness can remain adequate, yet fine-detail sharpness may change simply because the illumination wavelength has moved. When inspection algorithms compare images across several bands, that wavelength-dependent blur can affect edge position, small-defect visibility and even the apparent spectral signature of mixed pixels.

The strongest design approach is therefore to treat focus as a wavelength-dependent production parameter. Engineers should focus under actual SWIR illumination, measure sharpness at every operating band, determine whether one compromise focus position is sufficient, optimize aperture for the required focus tolerance, and validate performance after thermal stabilization and at real production speed. Perfect mathematical coincidence of every wavelength is not always necessary; what matters is that every wavelength remains sufficiently sharp for the inspection task it supports.

The Kyptec Automation® SWIR Camera Lens collection provides OEM machine builders and vision-system integrators with a focused family of 8.5 mm, 12.5 mm, 25 mm, 35 mm and 50 mm focal-length options specified for 900–1700 nm imaging, 2 MP resolution, 2/3-inch sensor format, F1.4 aperture and C-Mount. This allows the optical geometry to be matched to wide-area, medium-field or tightly framed SWIR inspection while keeping the lens selection within a dedicated wavelength-compatible portfolio.

For a buyer designing a multi-wavelength SWIR system, the best Kyptec Automation® SWIR Camera Lens is therefore the focal length that provides the correct inspection geometry and then demonstrates sufficient sharpness across every wavelength actually used by the machine. When wavelength-dependent focus is measured rather than assumed, multispectral SWIR imaging becomes more stable, more repeatable and better suited to demanding production inspection.